Molecular structure and thickness of highly oriented poly(tetrafluoroethylene) films measured by atomic force microscopy

Journal of Materials Science

Volumn 28, Issue 5, 1993, Pages 1372-1376

  Dietz, P ^a   Hansma, P K ^a   Ihn, K J ^a   Motamedi, F ^a   Smith, P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MOLECULAR STRUCTURE; PLASTIC FILMS; THICKNESS MEASUREMENT; THIN FILMS;

ATOMIC FORCE MICROSCOPY; HIGHLY ORIENTED FILMS; POLYTETRAFLUOROETHYLENE FILMS;

POLYTETRAFLUOROETHYLENES;

EID: 0027557899     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/BF01191980     Document Type: Article

References (15)

1. Atomic resolution with the atomic force microscope on conductors and nonconductors
2. Direct observation of individual fluorine ions on a SrF2(111) surface by atomic force microscopy