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Volumn 36, Issue 1, 1993, Pages 79-87
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A comparison of squeeze-film theory with measurements on a microstructure
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
FILMS;
FLOW OF FLUIDS;
MATHEMATICAL MODELS;
MICROSTRUCTURE;
OSCILLATIONS;
PHASE MEASUREMENT;
PLATES (STRUCTURAL COMPONENTS);
PRESSURE EFFECTS;
RESONANCE;
SILICON;
VISCOSITY;
VISCOSITY MEASUREMENT;
ISOLATED RECTANGULAR PLATES;
SQUEEZE FILM THEORY;
GAS DYNAMICS;
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EID: 0027557596
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/0924-4247(93)80144-6 Document Type: Article |
Times cited : (192)
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References (15)
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