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Volumn 326, Issue 1-2, 1993, Pages 27-37

Breakdown protection and long-term stabilisation for Si-detectors

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PROTECTION; SEMICONDUCTING SILICON;

EID: 0027556308     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(93)90329-G     Document Type: Article
Times cited : (66)

References (3)
  • 1
    • 84914031769 scopus 로고    scopus 로고
    • H. Gajewski et al., TOSCA Users Guide, Institut für angewandte Analysis und Stochastik, Berlin.
  • 2
    • 84914031768 scopus 로고    scopus 로고
    • R. Hünlich et al., DIOS Users Guide, Institut für angewandte Analysis und Stochastik, Berlin.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.