Measurement of the spatial resolution of double-sided double-metal AC-coupled silicon microstrips detectors

Nuclear Inst. and Methods in Physics Research, A

Volumn 326, Issue 1-2, 1993, Pages 189-197

  Brenner, R ^a   Harr, R ^a   Rudge, A ^a   Santos, D ^a   Straver, J ^a   Weilhammer, P ^a   Czermak, A ^b   Gadomski, S ^b   Turala, M ^b   Bonvicini, V ^c   Kucewicz, W ^c   Masciocchi, S ^c   Vegni, G ^c   Peisert, A ^d   Ardelan, J ^e   Hrisoho, A ^e   Troung, K ^e   Couchot, F ^e   Colledani, C ^f   Dulinski, W ^f   Husson, D ^f   Lounis, A ^f   Mayet, N ^f   Schaeffer, M ^f   Turchetta, R ^f   Smith, A ^g   Apsimon, R ^h   Seller, P ^h   Tyndel, M ^h   Aalste, M ⁱ   Hietanen, I ⁱ   Lindgren, J ⁱ   Osterberg, K ⁱ   Orava, R ⁱ   Ronnqvist, C ⁱ   Tuuva, T ⁱ   Voutilainen, M ⁱ   more..

^a CERN   (Switzerland)

^b INSTITUTE OF NUCLEAR PHYSICS   (Poland)

^c UNIVERSITY OF MILAN   (Italy)

^d SEZIONE DI PADOVA   (Italy)

^e UNIVERSITÉ PARIS SUD   (France)

^f LEPSI   (France)

^g UNIVERSITY OF LIVERPOOL   (United Kingdom)

^h RUTHERFORD APPLETON LABORATORY   (United Kingdom)

ⁱ HELSINKI INSTITUTE OF PHYSICS   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COLLIDING BEAM ACCELERATORS; MICROSTRIP DEVICES; SEMICONDUCTING SILICON;

DELHI EXPERIMENT; LEP STORAGE RINGS;

RADIATION DETECTORS;

EID: 0027556024     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(93)90350-Q     Document Type: Article

References (22)

1. Fabrication of low noise silicon radiation detectors by the planar process
2. these Proceedings 6th European Symp on Semiconductor Detectors
3. Development and performance of double sided silicon strip detectors
4. these Proceedings 6th European Symp. on Semiconductor Detectors
5. A new microstrip detector with double-sided readout
6. these Proceedings 6th European Symp. on Semiconductor Detectors