Design, Fabrication, and Testing of A High-Speed Analog Sampler

IEEE Transactions on Applied Superconductivity

Volumn 3, Issue 1, 1993, Pages 2562-2565

  Sage, J P ^a   Green, J B ^a   Davidson, A ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; MICROWAVE DEVICES; NETWORKS (CIRCUITS); SAMPLING;

ANALOG SAMPLERS; HIGH-SPEED SAMPLERS; JOSEPHSON-JUNCTION-BASED SAMPLERS; SAMPLING CIRCUITS;

JOSEPHSON JUNCTION DEVICES;

EID: 0027555553     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.233531     Document Type: Letter

References (3)

1. A., Davidson, Sample-and-Hold Gate Suitable for Small Josephson Junction Devices, IBM Tech. Disclosure Bull, 22, 9, 4269, Feb 1980
2. D., Go, A Superconducting Analog Track and Hold Circuit, IEEE Trans. Electron Devices, 35, 4, 498, 501, Apr 1988
3. M., Bhushan, E.M., Macedo, Nb/A1Ox/Nb Trilayer Process for the Fabrication of Submicron micron Josephson Junctions and Low-Noise dc SQUIDs, Appl. Phys. Lett, 58, 12, 1323, Mar 1991