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Volumn 3, Issue 1, 1993, Pages 2736-2739
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Performance of Mvtl or-and Gates When Data Precedes Bias
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Author keywords
[No Author keywords available]
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Indexed keywords
JOSEPHSON JUNCTION DEVICES;
LOGIC CIRCUITS;
MAGNETIC MEASURING INSTRUMENTS;
NIOBIUM;
SHIFT REGISTERS;
SUPERCONDUCTING MATERIALS;
OR-AND GATES;
SIX-STAGE SHIFT REGISTERS;
SQUIDS;
LOGIC GATES;
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EID: 0027553373
PISSN: 10518223
EISSN: 15582515
Source Type: Journal
DOI: 10.1109/77.233515 Document Type: Note |
Times cited : (7)
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References (7)
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