메뉴 건너뛰기




Volumn 16, Issue 1, 1993, Pages 53-59

Passivation Schemes for Copper/Polymer Thin-Film Interconnections Used in Multichip Modules

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COPPER; DIELECTRIC FILMS; MODULAR CONSTRUCTION; PASSIVATION; POLYMERS; THIN FILMS;

EID: 0027543093     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/33.214860     Document Type: Article
Times cited : (25)

References (25)
  • 1
    • 84939365379 scopus 로고
    • High density multichip interconnect for advanced packaging
    • Mar
    • J. J. H. Reche, “High density multichip interconnect for advanced packaging,” in Proc. NEPCON West, Mar. 1989, pp. 1308–1318.
    • (1989) Proc. NEPCON West , pp. 1308-1318
    • Reche, J.J.H.1
  • 3
    • 0001262301 scopus 로고
    • Polyimide on copper: The role of solvent in the formation of copper precipitates
    • Feb.
    • S. P. Kowalczyk, Y. H. Kim, G. F. Walker, and J. Kim, “Polyimide on copper: The role of solvent in the formation of copper precipitates,” Appl. Phys. Lett, vol. 52, no. 5, pp. 375–376, Feb. 1988.
    • (1988) Appl. Phys. Lett , vol.52 , Issue.5 , pp. 375-376
    • Kowalczyk, S.P.1    Kim, Y.H.2    Walker, G.F.3    Kim, J.4
  • 4
    • 84939362044 scopus 로고
    • Studies on interaction of polyimide with copper in curing process
    • K. Miyazaki, O. Miura, and S. Numata, “Studies on interaction of polyimide with copper in curing process, “ in Proc. ECS Fall Meeting, 1988, pp. 296-297.
    • (1988) Proc. ECS Fall Meeting , pp. 296-297
    • Miyazaki, K.1    Miura, O.2    Numata, S.3
  • 6
    • 0001761790 scopus 로고
    • Thin-film interdiffusions in Cu/Pd, Cu/Pt, Cu/Ni, Cu/NiB, Cu/Co, Cu/Cr, Cu/Ti, and Cu/TiN bilayer films: Correlations of sheet resistance with Rutherford backscattering spectrometries
    • Sept.
    • D.Y. Shih, C. A. Chang, J. Paraszczak, S. Nunes, and J. Cataldo, “Thin-film interdiffusions in Cu/Pd, Cu/Pt, Cu/Ni, Cu/NiB, Cu/Co, Cu/Cr, Cu/Ti, and Cu/TiN bilayer films: Correlations of sheet resistance with Rutherford backscattering spectrometries,” J. Appl. Phys., vol. 70, no. 6, pp. 3052–3060, Sept. 1991.
    • (1991) J. Appl. Phys. , vol.70 , Issue.6 , pp. 3052-3060
    • Shih, D.Y.1    Chang, C.A.2    Paraszczak, J.3    Nunes, S.4    Cataldo, J.5
  • 8
    • 0021510506 scopus 로고
    • An XPS and TEM study of intrinsic adhesion between polyimide and Cr films
    • Oct.
    • N. J. Chou, D. W. Dong, J. Kim, and A. C. Liu, “An XPS and TEM study of intrinsic adhesion between polyimide and Cr films,” J. Electrochem. Soc. : Solid-State Sci. Technoi., vol. 131, no. 10, pp. 2335–2340, Oct. 1984.
    • (1984) J. Electrochem. Soc. : Solid-State Sci. Technoi. , vol.131 , Issue.10 , pp. 2335-2340
    • Chou, N.J.1    Dong, D.W.2    Kim, J.3    Liu, A.C.4
  • 10
    • 84957275169 scopus 로고
    • Metal polyimide interface: A titanium reaction mechanism
    • May/June
    • F. S. Ohuchi and S. C. Freilich, “Metal polyimide interface: A titanium reaction mechanism,” J. Vac. Sci. Technoi., vol. 4, no. 3, pp. 1039–1045, May/June 1986.
    • (1986) J. Vac. Sci. Technoi. , vol.4 , Issue.3 , pp. 1039-1045
    • Ohuchi, F.S.1    Freilich, S.C.2
  • 11
    • 84918473489 scopus 로고
    • Interfacial reaction during metallization of cured polyimide: An XPS study
    • N. J. Chou and C. H. Tang, “Interfacial reaction during metallization of cured polyimide: An XPS study,” J. Vac. Sci. Technoi., vol. 2, no. 2, pp. 751–755, 1984.
    • (1984) J. Vac. Sci. Technoi. , vol.2 , Issue.2 , pp. 751-755
    • Chou, N.J.1    Tang, C.H.2
  • 12
    • 84941481279 scopus 로고
    • Measurement of high-speed signal propagation characteristics in thin-film interconnections
    • L.T. Hwang, G. M. Adema, G. A. Rinne, and I. Turlik, “Measurement of high-speed signal propagation characteristics in thin-film interconnections,” in Proc. Int. Electronics Packaging Conf., 1990, pp. 272–277.
    • (1990) Proc. Int. Electronics Packaging Conf. , pp. 272-277
    • Hwang, L.T.1    Adema, G.M.2    Rinne, G.A.3    Turlik, I.4
  • 21
    • 84941442440 scopus 로고
    • Dielectric materials for use in thin-film multichip modules
    • Feb.
    • G. M. Adema, M. J. Berry, and I. Turlik, “Dielectric materials for use in thin-film multichip modules,” Electron. Packaging Production, vol. 32, no. 2, Feb. 1992.
    • (1992) Electron. Packaging Production , vol.32 , Issue.2
    • Adema, G.M.1    Berry, M.J.2    Turlik, I.3
  • 23
    • 51249171186 scopus 로고
    • High rate magnetron RIE of thick polyimide films for advanced computer applications
    • G. J. Dishon, S. M. Bobbio, T. G. Tessier, Y. S. Ho, and R. Jewett, “High rate magnetron RIE of thick polyimide films for advanced computer applications,” J. Electron. Mat., vol. 18, no. 2, 1989.
    • (1989) J. Electron. Mat. , vol.18 , Issue.2
    • Dishon, G.J.1    Bobbio, S.M.2    Tessier, T.G.3    Ho, Y.S.4    Jewett, R.5
  • 25
    • 0022957210 scopus 로고
    • TEM/STEM sample preparation for the investigation of solid-state structures: Applications to electronic devices and computer components
    • R. E. Flutie, “TEM/STEM sample preparation for the investigation of solid-state structures: Applications to electronic devices and computer components,” in Proc. Materials Res. Soc. Symp., 1986, pp. 105–112.
    • (1986) Proc. Materials Res. Soc. Symp. , pp. 105-112
    • Flutie, R.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.