Imaging of zeolite surface structures by atomic force microscopy

Surface Science

Volumn 281, Issue 3, 1993, Pages

  Scandella, L ^a   Kruse, N ^a   Prins, R ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; IMAGE ANALYSIS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; SURFACES;

ATOMIC FORCE MICROSCOPY (AFM); MOLECULAR RESOLUTION; UNIT CELL LENGTH; ZEOLITE HEULANDITE; ZEOLITE SURFACE STRUCTURE;

ZEOLITES;

EID: 0027542169     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(93)90631-S     Document Type: Article

References (21)

1. Introduction to Zeolite Science and Practice
2. Catalysis and Adsorption by Zeolites
3. Zeolite crystallography. Structure determination in the absence of conventional single-crystal data
4. Surface Studies by Scanning Tunneling Microscopy
5. Atomic Force Microscope
6. Scanning Tunneling Microscopy II
7. Rastertunnel- und Kraftmikroskopie in der Organischen Chemie
8. Atomic Force Microscopy Of Micron Size Silicalite Crystals