PYFS—A Statistical Optimization Method for Integrated Circuit Yield Enhancement

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 12, Issue 2, 1993, Pages 296-309

  Pan, Shao Wei ^a   Hu, Yu Hen ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; OPTIMIZATION; STATISTICAL METHODS;

PSEUDO YIELD FUNCTION SUBSTITUTION; YIELD ENHANCEMENT;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0027542067     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.205009     Document Type: Article

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