A Cube-Connected Cycles Architecture with High Reliability and Improved Performance

IEEE Transactions on Computers

Volumn 42, Issue 2, 1993, Pages 246-253

  Tzeng, Nian Feng ^a  

^a UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

Author keywords

Cube connected cycles; fault tolerance; message broadcasting and routing; reliability analysis; VLSI layout

Indexed keywords

COMPUTER ARCHITECTURE; FAULT TOLERANT COMPUTER SYSTEMS; VLSI CIRCUITS;

CUBE CONNECTED CYCLES;

PARALLEL PROCESSING SYSTEMS;

EID: 0027541007     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.204798     Document Type: Article

References (8)

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