Experiment on Fault Location in Large-Scale

IEEE Transactions on Instrumentation and Measurement

Volumn 42, Issue 1, 1993, Pages 30-34

  Circuits, Analog ^a   Chen, Yunqing ^a  

^a Research Institute of Data Communication ^*  (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; ALGORITHMS; AUTOMATIC TESTING; ELECTRIC NETWORK TOPOLOGY; INTEGRATED CIRCUIT TESTING; LOW PASS FILTERS;

ACTIVE LOW PASS FILTERS; ANALOG CIRCUIT TESTING; AUTOMATED TEST EQUIPMENT; COMPUTER AIDED TESTING; COMPUTER ALGORITHMS; FAULT DIAGNOSIS;

NETWORKS (CIRCUITS);

EID: 0027539831     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.206675     Document Type: Article

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