A Clock Feedthrough Reduction Circuit for Switched-Current Systems

IEEE Journal of Solid-State Circuits

Volumn 28, Issue 2, 1993, Pages 133-137

  Song, Minkyu ^a   Lee, Yongman ^a   Kim, Wonchan ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; TIMING CIRCUITS;

CLOCK FEEDTHROUGH REDUCTION CIRCUITS; SWITCHED-CURRENT SYSTEMS; TEST PATTERNS;

SWITCHING CIRCUITS;

EID: 0027539696     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.192044     Document Type: Article

References (11)

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