Modeling Temperature Effects in the DC I-V Characteristics of GaAs MESFET's

IEEE Transactions on Electron Devices

Volumn 40, Issue 2, 1993, Pages 273-277

  Selmi, Luca ^a   Ricco, Bruno ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC PROPERTIES; MATHEMATICAL MODELS; SEMICONDUCTING GALLIUM ARSENIDE; VOLTAGE MEASUREMENT;

CURRENT-VOLTAGE CHARACTERISTICS; DC PERFORMANCE; HEAT FLOW EQUATIONS; TEMPERATURE EFFECTS MODELING;

MESFET DEVICES;

EID: 0027539642     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.182500     Document Type: Article

References (14)

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