Scan speed limit in atomic force microscopy

Journal of Microscopy

Volumn 169, Issue 1, 1993, Pages 75-84

  BUTT, H J ^a   SIEDLE, P ^a   SEIFERT, K ^a   FENDLER, K ^a   SEEGER, T ^a   BAMBERG, E ^a   WEISENHORN, A L ^b   GOLDIE, K ^c   ENGEL, A ^c  

^a MAX PLANCK INSTITUTE OF BIOPHYSICS   (Germany)

^b University of Perolles   (Switzerland)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

AFM; damping constant; resonance frequency; Scanning force microscope; STM

Indexed keywords

ARTICLE; SCANNING ELECTRON MICROSCOPY;

EID: 0027403888     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1993.tb03280.x     Document Type: Article

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