Configurational resonances in optical near-field microscopy: a rigorous point-dipole approach

Surface Science

Volumn 280, Issue 1-2, 1993, Pages 217-230

  Keller, Ole ^a   Xiao, Mufei ^a   Bozhevolnyi, Sergey ^a  

^a AALBORG UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY VALUE PROBLEMS; LINEAR ALGEBRA; PROBES; RESONANCE; SURFACES;

BORN SERIES EXPANSION; DIELECTRIC PROBES; GREEN'S FUNCTION FORMALISM; OPTICAL NEAR-FIELD MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0027307945     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(93)90370-Y     Document Type: Article

References (22)

1. Analyticity of the angular spectrum amplitude of scattered fields and some of its consequences
2. Near-field optical-scanning microscopy
3. External And Internal Reflection Near Field Microscopy: Experiments And Results
4. Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopy
5. Self-consistent study of dynamical and polarization effects in near-field optical microscopy
6. Near-field optics: Microscopy with nanometer-size fields
7. Elastic Scattering Of Light From A Few Atomic Dipoles On A Flat Metal Surface