Characterization of transistor mismatch for statistical CAD of sumicron CMOS analog circuits

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 1993, Pages 1401-1404

  Abel, Christopher J ^a   Michael, Christophey ^a   Ismail, Mohammed ^a   Teng, C S ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG COMPUTERS; COMPUTER AIDED DESIGN; NUMERICAL ANALYSIS; STATISTICAL METHODS; TRANSISTORS;

DRAIN CURRENTS; TRANSISTOR MISMATCH;

CMOS INTEGRATED CIRCUITS;

EID: 0027297610     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)