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Volumn 67, Issue 1-4, 1993, Pages 48-55
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Field emission from silicon through stable contaminant layers
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC CURRENTS;
IMPURITIES;
MATHEMATICAL MODELS;
SEMICONDUCTING FILMS;
SEMICONDUCTING SILICON;
SURFACE PHENOMENA;
SURFACES;
VOLTAGE MEASUREMENT;
FIELD EMISSIONS;
LINEAR FOWLER NORDHEIM PLOTS;
SELF REGULATING PROCESSES;
SILICON FIELD EMITTER ARRAYS;
STABLE CONTAMINANT LAYERS;
ELECTRON EMISSION;
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EID: 0027286993
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(93)90293-K Document Type: Article |
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Times cited : (3)
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References (17)
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