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Volumn 16, Issue 1-3, 1993, Pages 262-267

Deep centres for optical processing in CdTe

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DOPING (ADDITIVES); ELECTRONIC PROPERTIES; IMPURITIES; OPTICAL PROPERTIES; SEMICONDUCTING TELLURIUM COMPOUNDS;

EID: 0027286927     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(93)90057-T     Document Type: Article
Times cited : (57)

References (36)
  • 13
    • 84915449687 scopus 로고    scopus 로고
    • G. Brunthaler, R. T. Cox, W. Jantsch, U. Kaufmann and J. Schneider, in L. C. Kimerling and J. M. Parsey, Jr (eds.), Proc. 13th Int. Conf. on Defects in Semiconductors, The Metallurgical Society of AIME, New York, p. 1199.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.