Reliability of 0.1 μm INP HEMTS

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1993, Pages 364-371

  LaCombe, Donald J ^a   Hu, Wen Wei ^a   Bardsley, F R ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DEVICES; RELIABILITY;

RELIABILITY MODELS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0027281495     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)