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Volumn 15, Issue 2, 1993, Pages 134-149

Producing deep depth of field and depth-independent resolution in nde with limited diffraction beams

Author keywords

Bessel beams; image restoration; imaging; limited diffraction beams; materials; nondestructive evaluation; wave equations; X waves

Indexed keywords

STAINLESS STEEL; WATER;

EID: 0027272244     PISSN: 01617346     EISSN: None     Source Type: Journal    
DOI: 10.1177/016173469301500205     Document Type: Article
Times cited : (66)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.