Selfheating effects in silicon resistors operated at cryogenic ambient temperatures

Solid State Electronics

Volumn 36, Issue 1, 1993, Pages 41-52

  Gutiérrez D , Edmundo A ^a   Deferm, Ludo ^a   Declerck, Gilbert ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; LOW TEMPERATURE PHENOMENA; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SUBSTRATES;

CRYOGENIC AMBIENT TEMPERATURES; SELF-HEATING EFFECTS; SILICON RESISTORS;

RESISTORS;

EID: 0027269358     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(93)90067-Z     Document Type: Article

References (25)

1. Submicrometer-channel CMOS for low-temperature operation
2. MOSFET behavior and circuit considerations for analog applications at 77 K
3. Low-temperature CMOS 8 × 8 bit multipliers with sub-10-ns speeds
4. Switching characteristics of scaled CMOS circuits at 77 K
5. Performance and hot-carrier effects of small CRYO-CMOS devices
6. Very small MOSFET's for low-temperature operation
7. Semiconductors at cryogenic temperatures
8. Thermal effects in JFET and MOSFET devices at cryogenic temperatures
9. Two-dimensional carrier flow in a transistor structure under nonisothermal conditions
10. Physical origin of negative differential resistance in SOI transistors
11. Thermal effects in n-channel enhancement MOSFET's operated at cryogenic temperatures
12. Carrier multiplication in submicrometre pMOS transistors operated at cryogenic temperatures
13. Properties of Silicon
14. Computer simulation of integrated circuits in the presence of electrothermal interaction