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Volumn 14, Issue 1, 1993, Pages 13-15

Microwave Performance of a Digital Alloy Barrier A1(Sb, As)/AlSb/InAs Heterostructure Field-Effect Transistor

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; MICROWAVE DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0027261823     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.215085     Document Type: Article
Times cited : (34)

References (9)
  • 1
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    • An InAs channel heterojunction field-effect transistor with high transconductance
    • K. Yoh, T. Moriuchi, and M. Inoue, “An InAs channel heterojunction field-effect transistor with high transconductance,” IEEE Electron Device Lett., vol. 11, pp. 526–528, 1990.
    • (1990) IEEE Electron Device Lett. , vol.11 , pp. 526-528
    • Yoh, K.1    Moriuchi, T.2    Inoue, M.3
  • 2
    • 0026836813 scopus 로고
    • High-transconductance InAs/AlSb heterojunction field-effect transistors with S-doped AlSb upper barriers
    • J.D. Werking et al., “High-transconductance InAs/AlSb heterojunction field-effect transistors with S-doped AlSb upper barriers,” IEEE Electron Device Lett., vol. 13, pp. 164–166, 1992.
    • (1992) IEEE Electron Device Lett. , vol.13 , pp. 164-166
    • Werking, J.D.1
  • 3
    • 0026852334 scopus 로고
    • High-break-down-voltage AlSb/As/InAs n-channel field-effect transistors
    • X. Li, K. F. Longenbach, Y. Wang, and W. I. Wang, “High-break-down-voltage AlSb/As/InAs n-channel field-effect transistors,” IEEE Electron Device Lett., vol. 13, pp. 192–194, 1992.
    • (1992) IEEE Electron Device Lett. , vol.13 , pp. 192-194
    • Li, X.1    Longenbach, K.F.2    Wang, Y.3    Wang, W.I.4
  • 4
    • 0000830803 scopus 로고
    • Surface donor contribution to electron sheet concentrations in not-intentionally doped InAs-AlSb quantum wells
    • C. Nguyen, B. Brar, H. Kroemer, and J. H. English, “Surface donor contribution to electron sheet concentrations in not-intentionally doped InAs-AlSb quantum wells,” Appl. Phys. Lett., vol. 60, pp. 1854–1856, 1992.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 1854-1856
    • Nguyen, C.1    Brar, B.2    Kroemer, H.3    English, J.H.4
  • 5
    • 0343875042 scopus 로고
    • dc and rf measurements of the kink effect in 0.2 um gate length AlInAs/GalnAs/InP modulation-doped field-effect transistors
    • L. F. Palmateer, P. J. Tasker, W. J. Schaff, L. D. Nguyen, and L. F. Eastman, “dc and rf measurements of the kink effect in 0.2 um gate length AlInAs/GalnAs/InP modulation-doped field-effect transistors,” Appl. Phys. Lett., vol. 54, pp. 2139–2141, 1989.
    • (1989) Appl. Phys. Lett. , vol.54 , pp. 2139-2141
    • Palmateer, L.F.1    Tasker, P.J.2    Schaff, W.J.3    Nguyen, L.D.4    Eastman, L.F.5
  • 6
    • 84941490247 scopus 로고
    • The elimination of dc I-V anomalies in Ga0.47In0 53As-A1 0.48In0.52 As HEMTs
    • J.S. Harris Ed. (Inst. Phys Conf. Ser.)
    • A. S. Brown, U. K. Mishra, L. E. Larson, and S. E. Rosenbaum, “The elimination of dc I-V anomalies in Ga 0.47 In 0. 53 As-A1 0.48 In 0.52 As HEMTs,” in Proc. 15th Int. Symp. GaAs and Related Compounds (Atlanta, GA), J. S. Harris Ed. (Inst. Phys Conf. Ser.), vol. 96, 1988, pp. 445–448.
    • (1988) Proc. 15th Int. Symp. GaAs and Related Compounds (Atlanta, GA) , vol.96 , pp. 445-448
    • Brown, A.S.1    Mishra, U.K.2    Larson, L.E.3    Rosenbaum, S.E.4
  • 7
    • 0024011522 scopus 로고
    • Current-gain cutoff frequency comparison of InGaAs HEMT’s
    • K. Hikosaka, S. Sasa, N. Harada, and S. Kuroda, “Current-gain cutoff frequency comparison of InGaAs HEMT’s,” IEEE Electron Device Lett., vol. 9, pp. 241–243, 1988.
    • (1988) IEEE Electron Device Lett. , vol.9 , pp. 241-243
    • Hikosaka, K.1    Sasa, S.2    Harada, N.3    Kuroda, S.4
  • 9
    • 0026928230 scopus 로고
    • A temperature noise model for extrinsic FET’s
    • B. Hughes, “A temperature noise model for extrinsic FET’s,” IEEE Trans. Microwave Theory Tech., vol. 40, pp. 1821–1832, 1992.
    • (1992) IEEE Trans. Microwave Theory Tech , vol.40 , pp. 1821-1832
    • Hughes, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.