Soft-error-rate improvement in advanced BiCMOS SRAMs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1993, Pages 156-160

  Burnett, David ^a   Lage, Craig ^a   Bormann, Al ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; RELIABILITY;

BICMOS SRAMS;

SEMICONDUCTOR STORAGE;

EID: 0027259531     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1993.283330     Document Type: Conference Paper

References (14)