View Variation of Point-Set and Line-Segment Features

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 15, Issue 1, 1993, Pages 51-68

  Burns, J Brian ^a   Weiss, Richard S ^a   Riseman, Edward M ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

Index Terms; Object recognition projected feature variation view analysis view invariants

Indexed keywords

COMPUTER VISION; CONSTRAINT THEORY; GRAPH THEORY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE UNDERSTANDING; MATHEMATICAL TRANSFORMATIONS;

LINE SEGMENT FEATURES; POINT SET FEATURES; PROJECTED FEATURE VARIATION; THREE DIMENSIONAL OBJECT RECOGNITION; VIEW ANALYSIS; VIEW DESCRIPTION NETWORK; VIEW INVARIANTS;

PATTERN RECOGNITION;

EID: 0027255615     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.184774     Document Type: Article

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