Fast and robust 3D recognition by alignment

1993 IEEE 4th International Conference on Computer Vision

Volumn , Issue , 1993, Pages 113-120

  Alter, T D ^a   Eric, W ^a   Grimson, L ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNMENT; COMPUTER VISION; ERROR ANALYSIS; IMAGE PROCESSING;

3D OBJECTS; CLUTTERED BEAMS;

PATTERN RECOGNITION;

EID: 0027242754     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)