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Volumn 32, Issue 1 S, 1993, Pages 544-547
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Photoreflectance study of gaas/gaasp strained-barrier quantum well structures
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Author keywords
Band offset; GaAs; GaAsP; MOVPE; Photoreflectance; Quantum well; Strained layer; X ray diffraction
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Indexed keywords
BAND STRUCTURE;
EPITAXIAL GROWTH;
PHOSPHORUS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING GALLIUM COMPOUNDS;
SPECTROSCOPY;
BAND OFFSET;
PHOTOREFLECTANCE;
STRAINED LAYER;
X RAY DIFFRACTION;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 0027239365
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.32.544 Document Type: Article |
Times cited : (15)
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References (18)
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