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Volumn 3, Issue , 1993, Pages 1255-1258
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Novel technique for measuring small signal s-parameters of an RF/microwave, transistor, power amplifying stage for use in power amplifier stability analysis
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CIRCUIT OSCILLATIONS;
FREQUENCY STABILITY;
NEGATIVE RESISTANCE;
POWER AMPLIFIERS;
RESONANCE;
TRANSISTORS;
TUNING;
POWER AMPLIFYING STAGE;
RADIO FREQUENCY/MICROWAVE TRANSISTOR;
S-PARAMETER MEASUREMENT;
SMALL SIGNAL S-PARAMETER;
STABILITY ANALYSIS;
MICROWAVE MEASUREMENT;
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EID: 0027226898
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (5)
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