Novel self-stressing test structures for realistic high-frequency reliability characterization

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1993, Pages 57-65

  Snyder, Eric S ^a   Campbell, David V ^a   Swanson, Scot E ^a   Pierce, Donald G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; RELIABILITY;

ELECTROMIGRATION; HOT CARRIER-INDUCED DEGRADATION;

INTEGRATED CIRCUIT TESTING;

EID: 0027224621     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1993.283301     Document Type: Conference Paper

References (22)