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Volumn , Issue , 1993, Pages 269-273
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Lateral depletion-mode thyristors in SOI substrates
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
ELECTRIC CURRENT CONTROL;
ELECTRIC CURRENTS;
GATES (TRANSISTOR);
MOS DEVICES;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DEVICE TESTING;
SILICON ON INSULATOR TECHNOLOGY;
SUBSTRATES;
SWITCHING;
LATERAL DEPLETION MODE THYRISTOR;
MOS CONTROLLED CURRENT INTERRUPTION;
SILICON ON INSULATOR SUBSTRATES;
THYRISTORS;
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EID: 0027211386
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (10)
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