Imaging of polydiacetylenes by atomic force microscopy

Applied Surface Science

Volumn 65-66, Issue C, 1993, Pages 366-370

  Yamada, H ^a   Okada, S ^b   Fujii, T ^a   Kageshima, M ^c   Kawazu, A ^c   Matsuda, H ^b   Nakanishi, H ^b   Nakayama, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Research Institute for Polymers and Textiles   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; OPTICAL PROPERTIES; THIN FILMS;

ATOMIC FORCE MICROSCOPY; MOLECULAR ARRANGEMENTS; POLYDIACETYLENES; THIRD ORDER NONLINEAR OPTICAL SUSCEPTIBILITIES;

POLYACETYLENES;

EID: 0027211338     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(93)90687-7     Document Type: Article

References (7)

1. Evaluation of nonlinear optical susceptibility of polydiacetylenes by third harmonic generation
2. Atomic Force Microscope
3. Improved atomic force microscope images using microcantilevers with sharp tips