The Bispectrum of Sampled Data: Part I—detection of the Sampling Jitter

IEEE Transactions on Signal Processing

Volumn 41, Issue 1, 1993, Pages 296-

  Sharfer, Ilan ^a   Messer, Hagit ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BISPECTRA; HIGHER-ORDER SPECTRA; JITTER DETECTION; POWER SPECTRA; SAMPLED DATA; SIGNAL SKEWNESS;

RANDOM PROCESSES; SAMPLING; SIGNAL DETECTION; SIGNAL INTERFERENCE; SIGNAL PROCESSING;

SPECTRUM ANALYSIS;

EID: 0027208458     PISSN: 1053587X     EISSN: 19410476     Source Type: Journal    
DOI: 10.1109/TSP.1993.193147     Document Type: Article

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