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Volumn , Issue , 1993, Pages 71-76
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In situ monitoring and universal modelling of sacrificial PSG etching using hydrofluoric acid
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ETCHING;
HYDROFLUORIC ACID;
PSG ETCHING;
PSG MICROCHANNEL ETCHING;
ELECTROMECHANICAL DEVICES;
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EID: 0027202853
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (61)
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References (16)
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