Study of EST's short-circuit SOA

Volumn , Issue , 1993, Pages 71-76

  Iwamuro, N ^a   Shekar, M S ^a   Baliga, B J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; FAILURE ANALYSIS; GATES (TRANSISTOR); MECHANISMS; MOS DEVICES; SEMICONDUCTOR DEVICE STRUCTURES; SHORT CIRCUIT CURRENTS;

CURRENT SATURATION; DESTRUCTIVE FAILURE MECHANISM; EMITTER SWITCHED THYRISTOR; FORWARD BIASED SAFE OPERATING AREA; INSULATED GATE BIPOLAR TRANSISTORS; SHORT CIRCUIT STATE;

THYRISTORS;

EID: 0027187953     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)