Reflectance ratio: A photometric invariant for object recognition

1993 IEEE 4th International Conference on Computer Vision

Volumn , Issue , 1993, Pages 280-284

  Nayar, Shree K ^a   Bolle, Ruud M ^a  

^a Columbia Univ ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; IMAGE PROCESSING; LIGHT REFLECTION; PHOTOMETRY; SURFACES;

CURVED SURFACES; OBJECT RECOGNITION;

PATTERN RECOGNITION;

EID: 0027187209     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)