Lifetime projection method using series model and acceleration factors for TDDB failures of thin gate oxides

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1993, Pages 1-12

  Shiono, Noboru ^a   Itsumi, Manabu ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FAILURE ANALYSIS; RELIABILITY; VLSI CIRCUITS;

SERIES MODEL; WEIBULL DISTRIBUTION;

CMOS INTEGRATED CIRCUITS;

EID: 0027186750     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)