Delay fault coverage and performance tradeoffs

Proceedings - Design Automation Conference

Volumn , Issue , 1993, Pages 446-451

  Lam, William K ^a   Saldanha, Alexander ^a   Brayton, Robert K ^a   Sangiovanni Vincentelli, Alberto L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DELAY CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS; PERFORMANCE;

PATH DELAY FAULT MODELS; PERFORMANCE TRADEOFF;

COMBINATORIAL CIRCUITS;

EID: 0027152766     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)