Fully-digital testability of a high-speed conversion system

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1993, Pages 1595-1598

  Vital, Joao C ^a   Franca, Jose E ^a   Silva, Nuno S ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; AUTOMATIC TESTING; COMPUTER SIMULATION; DIGITAL TO ANALOG CONVERSION;

DEDICATED TEST MODELS; DIGITAL TESTABILITY; HIGH-SPEED CONVERSION SYSTEMS;

INTEGRATED CIRCUIT TESTING;

EID: 0027150380     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)