Algorithm for diagnosing two-line bridging faults in combinational circuits

Proceedings - Design Automation Conference

Volumn , Issue , 1993, Pages 520-524

  Chakravarty, Sreejit ^a   Gong, Yiming ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS;

COMBINATORIAL CIRCUIT FAULT DIAGNOSIS; TWO LINE BRIDGING FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0027149629     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/157485.165012     Document Type: Conference Paper

References (9)