Examination of the seu sensitivity of GaAs MESFETs via 2-D computer simulation and picosecond charge collection experiments

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1993, Pages 356-363

  Weatherford, T R ^a   McMorrow, D ^a   Curtice, W R ^a   Campbell, A B ^a   Knudson, A R ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE;

RELIABILITY MODELS;

MESFET DEVICES;

EID: 0027147936     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1993.283275     Document Type: Conference Paper

References (20)