Characterization of the broadband transmission behavior of interconnections on silicon substrates

1993 IEEE International Conference on Wafer Scale Integration

Volumn , Issue , 1993, Pages 268-277

  Zaage, S ^a   Grotelueschen, E ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTRONICS PACKAGING; MICROWAVE MEASUREMENT; SEMICONDUCTING SILICON; SUBSTRATES; VLSI CIRCUITS; WSI CIRCUITS;

CONDUCTIVE SILICON SUBSTRATES; HIGH SPEED CIRCUITS; INTERCONNECTION NETWORKS; MULTICHIP MODULES; WSI DEVICES;

TRANSMISSION LINE THEORY;

EID: 0027147899     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)