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Volumn 12, Issue 2, 1993, Pages 70-72
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Transmission electron microscopy characterization of a ceria-fluxed silicon nitride
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Author keywords
[No Author keywords available]
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Indexed keywords
CERIUM COMPOUNDS;
CHARACTERIZATION;
CRYSTAL MICROSTRUCTURE;
DOPING (ADDITIVES);
FLUXES;
GRAIN BOUNDARIES;
SINTERING;
TRANSMISSION ELECTRON MICROSCOPY;
CERIA FLUXED SILICON NITRIDE;
GAS PRESSURE SINTERING;
MULTIPLE GRAIN JUNCTIONS;
TWO-GRAIN BOUNDARIES;
SILICON NITRIDE;
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EID: 0027147544
PISSN: 02618028
EISSN: 15734811
Source Type: Journal
DOI: 10.1007/BF00241851 Document Type: Article |
Times cited : (20)
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References (17)
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