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Volumn 12, Issue 2, 1993, Pages 70-72

Transmission electron microscopy characterization of a ceria-fluxed silicon nitride

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CHARACTERIZATION; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); FLUXES; GRAIN BOUNDARIES; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0027147544     PISSN: 02618028     EISSN: 15734811     Source Type: Journal    
DOI: 10.1007/BF00241851     Document Type: Article
Times cited : (20)

References (17)
  • 11
    • 84931701048 scopus 로고    scopus 로고
    • J. S. VETRANO, H.-J. KLEEBE, E. HAMPP, M. J. HOFFMANN, R. M. CANNON and M. RÜHLE, J. Mater. Sci. submitted.
  • 15
    • 84931701046 scopus 로고    scopus 로고
    • H.-J. KLEEBE, J. Eur. Ceram. Soc. in press.
  • 16
    • 84931701047 scopus 로고    scopus 로고
    • D. R. CLARKE, Private communication (1991).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.