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Volumn 41, Issue 1, 1993, Pages 159-162

A note on experimental determination of small-signal equivalent circuit of millimeter-wave FETs

Author keywords

[No Author keywords available]

Indexed keywords

EQUIVALENT CIRCUITS; INDUCTANCE MEASUREMENT; MICROWAVE AMPLIFIERS; MILLIMETER WAVES;

EID: 0027146985     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.210247     Document Type: Article
Times cited : (24)

References (5)
  • 1
    • 0024048518 scopus 로고
    • A new method for determining The FET small-signal equivalent circuit
    • July
    • G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, “A new method for determining The FET small-signal equivalent circuit,” IEEE Trans. Microwave Theory Tech., vol. 36, no. 7, pp. 1151-1159, July 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , Issue.7 , pp. 1151-1159
    • Dambrine, G.1    Cappy, A.2    Heliodore, F.3    Playez, E.4
  • 2
    • 0025465290 scopus 로고
    • Broad-band determination of the FET small-signal equivalent circuit
    • July
    • M. Berroth and R. Bosch, “Broad-band determination of the FET small-signal equivalent circuit.” IEEE Trans. Microwave Theory Tech., vol. 38, no. 7, pp. 891-895, July 1990.
    • (1990) IEEE Trans. Microwave Theory Tech. , vol.38 , Issue.7 , pp. 891-895
    • Berroth, M.1    Bosch, R.2
  • 3
    • 0026103702 scopus 로고
    • High-frequency equivalent circuit of GaAs FET’s for large-signal applications
    • Feb
    • M. Berroth and R. Bosch, “High-frequency equivalent circuit of GaAs FET’s for large-signal applications,” IEEE Trans. Microwave Theory Tech., vol. 39, no. 2, pp. 224-229, Feb. 1991.
    • (1991) IEEE Trans. Microwave Theory Tech. , vol.39 , Issue.2 , pp. 224-229
    • Berroth, M.1    Bosch, R.2
  • 4
    • 0022061068 scopus 로고
    • Source, drain, and gate series resistances and electron saturation velocity in ion-implanted GaAs FET’s
    • May
    • K. W. Lee, K. Lee, M. S. Shur, T. T. Vu, P. C. T. Roberts, and M. J. Helix, “Source, drain, and gate series resistances and electron saturation velocity in ion-implanted GaAs FET’s,” IEEE Trans. Electron Devices, vol. ED-32, no. 5, pp. 987-991, May 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , Issue.5 , pp. 987-991
    • Lee, K.W.1    Lee, K.2    Shur, M.S.3    Vu, T.T.4    Roberts, P.C.T.5    Helix, M.J.6
  • 5
    • 0026107986 scopus 로고
    • Determination of intrinsic FET parameters using circuit partitioning approach
    • Feb
    • H. Vickes, “Determination of intrinsic FET parameters using circuit partitioning approach,” IEEE Trans. Microwave Theory Tech., vol. 39, no. 2, pp. 363-366, Feb. 1991.
    • (1991) IEEE Trans. Microwave Theory Tech. , vol.39 , Issue.2 , pp. 363-366
    • Vickes, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.