Effects of Local Variations in Skull and Scalp Thickness on EEG's and MEG's

IEEE Transactions on Biomedical Engineering

Volumn 40, Issue 1, 1993, Pages 42-48

  Cuffin, B Neil ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; BIOMEDICAL ENGINEERING; COMPUTER SIMULATION; EEG;

COMPUTER MODELS; MAGNETOENCEPHALOGRAMS; SCALP THICKNESS EFFECTS; SKULL VARIATION EFFECTS;

ELECTROENCEPHALOGRAPHY;

ARTICLE; COMPUTER MODEL; ELECTROENCEPHALOGRAM; MAGNETOENCEPHALOGRAPHY; SCALP; SKULL;

ACTION POTENTIALS; BIAS (EPIDEMIOLOGY); BRAIN; CEPHALOMETRY; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROENCEPHALOGRAPHY; ELECTROMAGNETIC FIELDS; EVALUATION STUDIES; HUMAN; MAGNETOENCEPHALOGRAPHY; MODELS, ANATOMIC; SCALP; SKINFOLD THICKNESS; SKULL; SUPPORT, U.S. GOV'T, P.H.S.;

EID: 0027131504     PISSN: 0018-9294     EISSN: 1558-2531     Source Type: Journal    
DOI: 10.1109/10.204770     Document Type: Article

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