Ultimate resolution and information in electron microscopy: general principles

Ultramicroscopy

Volumn 47, Issue 1-3, 1992, Pages 266-281

  Van Dyck, D ^a   de Jong, A F ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL CAPACITY; COMMUNICATION CHANNELS (INFORMATION THEORY); IMAGE RECORDING; INFORMATION THEORY; MICROANALYSIS; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION;

ATOM POSITIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; SUBCHANNELS;

ELECTRON MICROSCOPES;

CONFERENCE PAPER; ELECTRON MICROSCOPY; IMAGE ANALYSIS; MICROSCOPE IMAGE;

EID: 0027109828     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(92)90202-U     Document Type: Article

References (28)

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2. Beugung in inhomogenen Primärstrahlenwellenfeld. II. Lichtoptische Analogieversuche zur Phasenmessung von Gitterinterferenzen
3. Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen Objekten
4. XXXI.Investigations in optics, with special reference to the spectroscope
5. XLVI.Investigations in optics, with special reference to the spectroscope
6. LVI.Investigations in optics, with special reference to the spectroscope
7. V.Investigations in optics, with special reference to the spectroscope
8. Communication in the Presence of Noise
9. Information Theory and Optical Images
10. EUREM '88
11. A.F. de Jong and D. Van Dyck, Ultramicroscopy, in press.
12. Electron Image Plane Off-axis Holography of Atomic Structures
13. Theory of Electron Interference Experiments
14. Optical resolution: an analysis based on catastrophe theory
15. Image Calculations in High-Resolution Electron Microscopy: Problems, Progress, and Prospects