메뉴 건너뛰기




Volumn 47, Issue 1-3, 1992, Pages 55-79

Resolution in soft X-ray microscopes

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; OPTICAL RESOLVING POWER; THEORY; X RAY APPARATUS; X RAYS;

EID: 0027109805     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(92)90185-M     Document Type: Article
Times cited : (60)

References (182)
  • 3
    • 0001873370 scopus 로고
    • Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen
    • (Leipzig)
    • (1952) Annalen der Physik , vol.10 , pp. 94
    • Wolter1
  • 32
    • 7344268488 scopus 로고
    • X-ray holographico microscopy of biological specimens using an undulator
    • State Univesity of New York, Stony Brook
    • (1988) PhD Dissertation
    • Jacobsen1
  • 35
    • 0000736827 scopus 로고
    • Low Energy X-ray Diagnostics
    • D.T. Attwood, B.L. Henke, Am. Inst. Phys, New York
    • (1981) AIP Conf. Proc. vn75 , pp. 146-155
    • Henke1
  • 61
    • 84909937475 scopus 로고
    • Free Electron Generation of Extreme Ultraviolet Coherent Radiations
    • J.M.J. Madey, C. Pellegrini, Am. Inst. Phys, New York
    • (1983) AIP Conf. Proc. , vol.118 , pp. 85-95
    • Howells1    Kirz2
  • 68
    • 0022250689 scopus 로고
    • Applications of Thin Film Multilayered Structures to Figured X-ray Optics
    • See e.g.
    • (1985) Proc. SPIE , vol.563
    • Marshall1
  • 75
    • 84914262202 scopus 로고
    • Design Considerations of Zone Plate Optics for a Scanning Transmission X-ray Microscope
    • London University, and ch. 9 of ref. [15]
    • (1984) PhD Thesis
    • Simpson1
  • 77
    • 84914294385 scopus 로고    scopus 로고
    • G. Schmahl, private communication
  • 78
    • 84914294384 scopus 로고    scopus 로고
    • C. Buckley, private communication.
  • 131
    • 84914294383 scopus 로고
    • Principle Of A "Reconstruction Microscope" For High Resolution X-Ray Holography
    • (1989) Proc. SPIE , vol.1140 , pp. 399
    • Joyeux1    Polack2    Mercier3
  • 139
    • 0007533841 scopus 로고
    • Surface and Interface Characterization by Electron Optical Methods
    • A. Howie, U. Valdré, Plenum Press, New York
    • (1988) NATO ASI , vol.191 , pp. 195-233
    • Bauer1    Tilieps2
  • 161
    • 84914294381 scopus 로고    scopus 로고
    • S. Williams, X. Zhang, C. Jacobsen, J. Kirz, S. Lindaas, J. Van 't Hof and A. Lamm, J. Microscopy, in press.
  • 166
    • 84914294380 scopus 로고    scopus 로고
    • S. Williams, X. Zhang, C. Jacobsen, J. Kirz, S. Lindaas, J. Van 't Hof and A. Lamm, J. Microscopy, in press.
  • 168
    • 84914294379 scopus 로고    scopus 로고
    • T. Budinger, private communication.
  • 181
    • 84914294378 scopus 로고    scopus 로고
    • J. Underwood, private communication.
  • 182
    • 84914294377 scopus 로고    scopus 로고
    • See papers in: C. Jacobsen and J. Trebes, Eds., Soft X-ray Microscopy, Proc. SPIE 1741, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.