X-ray diffraction measurements for liquid As2Se3 up to the semiconductor-metal transition region

Journal of Non-Crystalline Solids

Volumn 150, Issue 1-3, 1992, Pages 35-39

  Hosokawa, Shinya ^a   Sakaguchi, Yoshifumi ^a   Tamura, Kozaburo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; X RAYS;

ARSENIC TRISELENIDE; OPTICAL GAP; SEMICONDUCTOR-METAL TRANSITIONS;

ARSENIC COMPOUNDS;

EID: 0027109626     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(92)90090-7     Document Type: Article

References (13)

1. Semiconductor-metal transition in fluid selenium near the critical point
2. Density measurement for fluid selenium by the X-ray absorption method
3. Neutron diffraction study of amorphous As2Se3 and AsSe