Path sensitization in critical path problem

1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

Volumn , Issue , 1992, Pages 208-211

  Chen, Hsi Chuan ^a   Du, David H C ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED LOGIC DESIGN; TESTING;

CRITICAL PATH PROBLEM; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0027084263     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)