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Volumn , Issue , 1992, Pages
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Investigation of BiCMOS ESD protection circuit elements and applications in submicron technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR INTEGRATED CIRCUITS;
CMOS INTEGRATED CIRCUITS;
ELECTRIC DISCHARGES;
ELECTRIC NETWORK ANALYZERS;
ELECTROSTATICS;
GATES (TRANSISTOR);
INTEGRATED CIRCUIT LAYOUT;
OVERCURRENT PROTECTION;
TRANSISTORS;
BREAKDOWN THRESHOLD VOLTAGE;
ELECTROSTATIC DISCHARGE (ESD);
ESD PROTECTION CIRCUITS;
HIGH SPEED INTEGRATED CIRCUITS;
NMOS TRANSISTORS;
OVERVOLTAGE PROTECTION;
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EID: 0027043849
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (20)
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