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Volumn , Issue , 1992, Pages

Investigation of BiCMOS ESD protection circuit elements and applications in submicron technologies

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; ELECTRIC NETWORK ANALYZERS; ELECTROSTATICS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; OVERCURRENT PROTECTION; TRANSISTORS;

EID: 0027043849     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.