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Volumn , Issue , 1992, Pages
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MOSFET drain engineering for ESD performance
a
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Author keywords
[No Author keywords available]
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Indexed keywords
EFFECTS;
ELECTRIC DISCHARGES;
ELECTROSTATICS;
GATES (TRANSISTOR);
HOT CARRIERS;
INTEGRATED CIRCUIT MANUFACTURE;
MOSFET DEVICES;
RELIABILITY;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR JUNCTIONS;
DOUBLE DIFFUSED DRAIN (DDD);
DRAIN ENGINEERING;
ELECTROSTATIC DISCHARGES (ESD);
HUMAN BODY MODEL (HBM);
LIGHTLY DOPED DRAIN (LDD) STRUCTURES;
MODERATELY DIFFUSED DRAIN (MDD);
OVERVOLTAGE PROTECTION;
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EID: 0027041816
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (3)
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