The use of a digital multiplexer to reduce process control chip pad count

Volumn , Issue , 1992, Pages 129-133

  Ward, D ^a   Walton, A J ^a   Gammie, W G ^a   Holwill, R J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLEXING EQUIPMENT; PROCESS CONTROL; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DIODES;

DIGITAL MULTIPLEXERS; DIODE INTERCONNECTS; ON-CHIP SWITCHING;

INTEGRATED CIRCUIT TESTING;

EID: 0027038688     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)